Semiconductor measurement technology progress report, January to June 1976

Cover of: Semiconductor measurement technology progress report, January to June 1976 |

Published by National Bureau of Standards in Washington .

Written in English

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Edition Notes

Book details

Statementeditor W Murray Bullis, jointly supported by National Bureau of Standards [and others].
SeriesSpecial publication -- 400-29.
ContributionsBullis, W Murray., National Bureau of Standards.
ID Numbers
Open LibraryOL19949748M

Download Semiconductor measurement technology progress report, January to June 1976

Get this from Semiconductor measurement technology progress report library. Semiconductor measurement technology: progress report, January 1 to J [W Murray Bullis; United States. National Bureau of Standards.]   Activities directed toward the development of methods of measurement for semiconductor materials, process control, and devices are described.

The emphasis is on silicon device technologies. Principal accomplishments included (1) preliminary results of a systematic study of the effects of surface preparation on spreading resistance measurements; (2) development of an optical test for surface However, recent developments in semiconductor technology and nano-scale materials have enabled significant technological advancement, demonstrating the potential for groundbreaking achievements in the field.

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The journal publishes cutting-edge research on the physical properties of semiconductors and their applications. We report here on the concepts behind the design of the facility and on details of the operation, Measurement setup and data Browse all the volumes of Nature.

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